David M. Longo, Ph.D. is a partner in the firm’s Electrical, Mechanical, and Design practice groups, and is the chair of the firm’s Prosecution Management Committee. His attention to details, determination, and focus on prompt and efficient communications have garnered the confidence of the firm’s clients in his ability to diligently handle their important matters. International and domestic clients rely on him to help them develop and grow their patent portfolios.
His legal practice covers all aspects of strategic counseling and patent portfolio management. This includes patent prosecution, reissue applications, reexamination requests, ex parte appeals, opinions of counsel, freedom-to-operate and landscape analyses, due diligence analyses, pre-litigation counseling, and license negotiations. He also regularly travels to Europe and Japan to speak on a variety of U.S. patent law topics for clients and practitioners.
Dr. Longo’s technical experience bridges the materials science and electrical engineering fields, particularly in the areas of semiconductor materials and devices, semiconductor processing and characterization, thin film deposition and analysis, nanotechnology (including nanoprinting, nanocomposites, nanocrystals, and nanoparticles), battery materials (including anode and cathode materials for lithium and Li-ion batteries), alternative lithography technologies, fiber optics/optoelectronics, and microelectromechanical systems (MEMS). He also has significant experience in focused ion beam (FIB) microscopy and micromachining, transmission electron microscopy (TEM), scanning electron microscopy (SEM), and atomic force microscopy (AFM). Collectively, this experience has enabled Dr. Longo to help his clients obtain patents across a diverse array of technical fields, from consumer electronic products to medical devices, photovoltaics, and battery management systems (BMS).
His Ph.D. dissertation, entitled “Development of a Deep Submicron Printing Technology,” significantly contributed to a Defense Advanced Research Projects Agency (DARPA) project for nanoscale printing of electronic materials onto planar and curved surfaces. His experimental research applied FIB direct-write technology to fabricate complex nanoscale patterns on reusable printheads. Elastomer replicas of the printheads were cast, coated with self-assembled monolayers, and ultimately “printed” onto semiconductor substrates and glass lenses using a combination of microcontact printing and etching. Other academic research involved FIB microscopy and FIB-assisted material deposition, as well as analytical TEM to study the effects of heat treatment on nanoscale films and diffusion barriers deposited onto single-crystal silicon substrates.
Dr. Longo has several technical publications and has spoken on his nanoscale printing research at technical conferences. He has also spoken on developments in U.S. patent law and the patenting process at technical meetings in the U.S., as well as at nanotech consultancy conferences in Spain and Egypt.
Prior to joining the firm, Dr. Longo worked for another law firm primarily in the areas of patent counseling and prosecution, and worked full time as a patent agent while attending law school.
George Washington University Law School
University of Virginia
- Materials Science & Engineering
University of Virginia
- Materials Science & Engineering
University of Scranton
- District of Columbia
- New Jersey
- U.S. Patent and Trademark Office
- Eastern District of Virginia
- Court of Appeals for the Federal Circuit
- Court of Appeals for Veterans Claims
- U.S. Supreme Court
- Second Prize in Nathan Burkan Memorial Paper Competition, sponsored by A.S.C.A.P., for paper entitled “Using the D.M.C.A. Anticircumvention Provisions to Avoid § 102(b) of the Copyright Act and the Limited Times Clause in Art. I, § 8 of the U.S. Constitution” (2004)
- Received five awards between 1998 and 2000 for research and scholastic activities while a graduate student.
- Y. Liu, D.M. Longo, and R. Hull, “Ultra Rapid Nanostructuring of Polymethlmethacrylate (PMMA) films using Ga+ focused ion beams,” Appl. Phys. Lett., 82(3), 346-348, (2003).
- R. Hull, T. Chraska, Y. Liu, and D.M. Longo, “Microcontact Printing: New Mastering and Transfer Techniques for High Throughput, Resolution, and Depth of Focus,” Mat. Sci. Eng. C19, 383-392 (2002).
- D.M. Longo, W.E. Benson, T. Chraska, and R. Hull, “Deep Submicron Microcontact Printing of Electronic Materials Utilizing Focused Ion Beam Fabricated Printheads,” Appl. Phys. Lett., 78(7), 981-983, (2001).
- D.M. Longo and R. Hull, “Direct Focused Ion Beam Writing of Printheads for Pattern Transfer Utilizing Microcontact Printing,” Mat. Res. Soc. Symp. Proc.: Materials Development for Direct Write Technologies, 624, 157-162, (2001).
- D.M. Longo and R. Hull, “Microcontact Printing (µCP) of Electronic Materials Utilizing Focused Ion Beam Fabricated Printheads,” Proc. 1999 Intl. Semicond. Dev. Res. Symp., 33-36 (1999).
- R. Hull and D.M. Longo, “Development of a Nanoscale Printing Technology for Planar and Curved Surfaces,” Proc. 10th Intl. Work. Phys. Semicond. Dev., New Delhi, India, II, 974-981 (1999); also available through the Proceedings of SPIE (The Int’l Soc. of Optical Eng.) 3975, 974-981 (2000).
- D.M. Longo, J.M. Howe, and W.C. Johnson, “Development of a Focused Ion Beam (FIB) Technique to Minimize X-ray Fluorescence during Energy Dispersive X-ray Spectroscopy (EDS) of FIB Specimens in the Transmission Electron Microscope (TEM),” Ultramicroscopy, 80(2), 85-97, (1999).
- D.M. Longo, J.M. Howe, and W.C. Johnson, “Experimental Method for Determining Cliff-Lorimer Factors in Transmission Electron Microscopy (TEM) Utilizing Stepped Wedge-Shaped Specimens Prepared by Focused Ion Beam (FIB),” Ultramicroscopy, 80(2), 69-84, (1999). (Micrographs from this article selected by editor Pieter Kruit for the cover illustration of the Oct. 1999 issue of Ultramicroscopy.)
- D.M. Longo, J.M. Howe, and W.C. Johnson, “The Effect of Focused Ion Beam (FIB) Specimen Geometry on X-ray Fluorescence During Energy Dispersive X-ray Spectroscopy (EDS) Analysis in the Transmission Electron Microscope (TEM),” Proc. of Microscopy and Microanalysis, 4, 856-857, (1998).
- American Intellectual Property Law Association (AIPLA)
- U.S. Bar – Japan Patent Office Liaison Council (represent Virginia Bar IP Section)
- Materials Research Society (MRS)
- Institute of Electrical and Electronics Engineers (IEEE)