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Oblon Spivak McClelland Maier and Neustadt, L.L.P.
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2010 Patent Reexamination/Reissue Year in Review

Date: 
December 15, 2010
Author(s): 
Scott A. McKeown
 
Practice Area(s): 
Post Grant Patent Proceedings
Publication: 
LexisNexis Podcast - 2010 Patent Reexamination/Reissue Year in Review

Scott A. McKeown of Oblon, Spivak discusses patent reexamination and patent reissue, recent developments at the USPTO and their impact on litigation strategy. He also looks at cases before the Federal Circuit and Supreme Court that may impact the patent reexamination/patent reissue landscape in 2011.

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